Revised electrochemical etching system for a reproducible fabrication of ultra-sharp tungsten tips
Author:
Publisher
Springer Science and Business Media LLC
Subject
Materials Chemistry,Electrochemistry,General Chemical Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10800-020-01516-y.pdf
Reference98 articles.
1. Schoelz JK, Xu P, Barber SD et al (2012) High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy. J Vac Sci Technol B 30:33201. https://doi.org/10.1116/1.3701977
2. Kulawik M, Nowicki M, Thielsch G et al (2003) A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors. Rev Sci Instrum 74:1027–1030. https://doi.org/10.1063/1.1532833
3. Klein M, Schwitzgebel G (1997) An improved lamellae drop-off technique for sharp tip preparation in scanning tunneling microscopy. Rev Sci Instrum 68:3099–3103. https://doi.org/10.1063/1.1148249
4. Bani Milhim A, Ben Mrad R (2014) Electrochemical etching technique: conical-long-sharp tungsten tips for nanoapplications. J Vac Sci Technol B 32:031806. https://doi.org/10.1116/1.4873700
5. Ju B-F, Chen Y-L, Ge Y (2011) The art of electrochemical etching for preparing tungsten probes with controllable tip profile and characteristic parameters. Rev Sci Instrum 82:013707. https://doi.org/10.1063/1.3529880
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