Glow‐discharge mass spectrometry—Technique for determining elemental composition profiles in solids
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1663490
Reference29 articles.
1. A New Technique for the Elemental Analysis of Thin Surface Layers of Solids
2. Microanalysis of Materials by Backscattering Spectrometry
3. Use of Auger Electron Spectroscopy and Inert Gas Sputtering for Obtaining Chemical Profiles
4. Ion Scattering Spectrometry
5. Ion Microprobe Mass Analyzer
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