Structural and electronic characterization of 355 nm laser-crystallized silicon: Interplay of film thickness and laser fluence
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4872464
Reference23 articles.
1. Effects of crystallization mechanism on the electrical characteristics of green continuous-wave-laser-crystallized polycrystalline silicon thin film transistors
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3. Nd:YVO4 Laser Crystallization for Thin Film Transistors with a High Mobility
4. Chapter 1 Introduction to Laser Crystallization of Silicon
5. Excimer laser induced crystallization of amorphous silicon on flexible polymer substrates
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3. Impact of substrate composition on the morphology and conductivity of laser-crystallized silicon films;Applied Physics A;2015-07-19
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