Effect of native oxide on the interface property of GaAs MIS structures
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90495
Reference3 articles.
1. Anomalous frequency dispersion of m.o.s. capacitors formed on n-type GaAs by anodic oxidation
2. Anodic Oxidation of GaAs Using Oxygen Plasma
3. Reactive sputtering of gallium nitride thin films for GaAs MIS structures
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