Current-driven nanowire formation on surfaces of crystalline conducting substrates

Author:

Kumar Ashish1,Dasgupta Dwaipayan1ORCID,Dimitrakopoulos Christos1ORCID,Maroudas Dimitrios1

Affiliation:

1. Department of Chemical Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003-9303, USA

Funder

U.S. Department of Energy (DOE)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Reference42 articles.

1. K.-N. Tu , “ Fundamentals of Electromigration,” in Solder Joint Technology: Materials, Properties, and Reliability ( Springer, New York, NY, 2007), pp. 211–243.

2. Visualizing the Electron Scattering Force in Nanostructures

3. Current-Induced Stabilization of Surface Morphology in Stressed Solids

4. Nonlinear Wavelength Selection in Surface Faceting under Electromigration

5. K.-N. Tu , “ Thermomigration,” in Solder Joint Technology: Materials, Properties, and Reliability ( Springer, New York, NY, 2007), pp. 327–346.

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