Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction-Reference-Cited by-同舟云学术

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

Published:2017-08-21 Issue:8 Volume:111 Page:082907
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Nakashima Seiji¹,Sakata Osami²,Funakubo Hiroshi³,Shimizu Takao³,Ichinose Daichi³,Takayama Kota¹,Imai Yasuhiko⁴,Fujisawa Hironori¹,Shimizu Masaru¹

Affiliation:

1. Department of Electronics and Computer Science, Graduate School of Engineering, University of Hyogo, Himeji, Hyogo 671-2201, Japan

2. Synchrotron X-ray Group, Research Center for Advanced Measurement and Characterization, National Institute of Materials Science (NIMS), Sayo, Hyogo 679-5198, Japan

3. Department of Materials Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama 226-8502, Japan

4. Japan Synchrotron Radiation Research Institute (JASRI)/Sayo, Hyogo 679-5198, Japan

Funder

Japan Society for the Promotion of Science (JSPS)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5000495

Reference28 articles.

1. Ferroelectric thin films for micro-sensors and actuators: a review

2. Sensors based on piezoelectric resonators