Time-resolved X-ray diffraction system for study of Pb(Zr, Ti)O3 films under a temporal electric field at BL15XU, SPring-8-Reference-Cited by-同舟云学术

Time-resolved X-ray diffraction system for study of Pb(Zr, Ti)O3 films under a temporal electric field at BL15XU, SPring-8

Published:2019-09 Issue:9 Volume:90 Page:093001
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Seo Okkyun¹²,Kim Jaemyung¹²,Song Chulho²,Katsuya Yoshio²^ORCID,Shimada Yoshitomo³,Yamada Tomoaki⁴⁵^ORCID,Sakata Osami¹²⁶^ORCID

Affiliation:

1. Synchrotron X-ray Group, Research Center for Advanced Measurement and Characterization, National Institute for Materials Science (NIMS), 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan

2. Synchrotron X-ray Station as SPring-8, Research Network and Facility Services Division, NIMS, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan

3. SPring-8 Service Co., Ltd., Tatsuno, Hyogo 679-5165, Japan

4. Department of Energy Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan

5. PRESTO, Japan Science and Technology Agency, Kawaguchi 332-0012, Japan

6. Department of Materials and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 4259-J3-16, Nagatsuta Midori, Yokohama 226-8502, Japan

Funder

National Research Foundation of Korea

Ministry of Education, Culture, Sports, Science and Technology

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5110337

Reference27 articles.

1. Electronic Structure of Warm Dense Copper Studied by Ultrafast X-Ray Absorption Spectroscopy

2. Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources

3. Spatially confined low-power optically pumped ultrafast synchrotron x-ray nanodiffraction

4. Direct observation of intrinsic piezoelectricity of Pb(Zr,Ti)O3 by time-resolved x-ray diffraction measurement using single-crystalline films

5. Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

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