Regulation of a microcantilever response by force feedback
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.109413
Reference13 articles.
1. Atomic Force Microscope
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
3. Magnetic force microscopy: General principles and application to longitudinal recording media
4. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
5. Interaction force detection in scanning probe microscopy: Methods and applications
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