Reaction pathway analysis for dislocation nucleation from a Ni surface step
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3254178
Reference32 articles.
1. L. B. Freund and S. Suresh,Thin Film Materials(Cambridge University Press, Cambridge, 2003), p. 387.
2. Defects in epitaxial multilayers
3. Influence of surface steps on glide of threading dislocations during layer growth
4. Formation of misfit dislocations in nanoscale Ni–Cu bilayer films
5. Interface dislocation structures at the onset of coherency loss in nanoscale Ni–Cu bilayer films
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