Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://scitation.aip.org/deliver/fulltext/aip/journal/apl/104/9/1.4867165.pdf?itemId=/content/aip/journal/apl/104/9/10.1063/1.4867165&mimeType=pdf&containerItemId=content/aip/journal/apl
Reference14 articles.
1. Cathodoluminescence spectral mapping of III-nitride structures
2. Scanning cathodoluminescence microscopy: A unique approach to atomic-scale characterization of heterointerfaces and imaging of semiconductor inhomogeneities
3. Simultaneous composition mapping and hyperspectral cathodoluminescence imaging of InGaN epilayers
4. CASINO V2.42—A Fast and Easy-to-use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users
5. High-Resolution Cathodoluminescence Hyperspectral Imaging of Nitride Nanostructures
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Metastable atomic-ordered configurations for Al1/2Ga1/2N predicted by Monte-Carlo method based on first-principles calculations;Journal of Physics: Condensed Matter;2023-12-20
2. Core–Shell Nanorods as Ultraviolet Light-Emitting Diodes;Nano Letters;2023-02-07
3. Influence of sapphire substrate with miscut angles on hexagonal boron nitride films grown by halide vapor phase epitaxy;CrystEngComm;2023
4. Effects of Pre-Metallization on the MOCVD Growth and Properties of Ge-doped AlGaN on AlN/Sapphire Templates;Journal of Electronic Materials;2022-12-12
5. Weak metastability of Al x Ga1−x N (x = 13/24, 15/24, 17/24) shown by analyzing AlGaN grown on AlN with dense macrosteps;Applied Physics Express;2022-06-27
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3