Investigation of carrier transport through silicon wafers by photocurrent measurements
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.356022
Reference24 articles.
1. Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method
2. A method of determining the lifetime and diffusion coefficient of minority carriers in a semiconductor wafer
3. A measurement of a minority‐carrier lifetime in ap‐type silicon wafer by a two‐mercury probe method
4. Surface-state density and surface potential in MIS capacitors by surface photovoltage measurements. I
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