The influence of thermal cycling on the activation energy of conduction electrons and filament temperature in Pt/NiO<i>x</i>/Pt ReRAMs-Reference-Cited by-同舟云学术

The influence of thermal cycling on the activation energy of conduction electrons and filament temperature in Pt/NiOx/Pt ReRAMs

Published:2023-06-19 Issue:25 Volume:122 Page:
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:

Author:

Alagoz H. S.¹^ORCID,Egilmez M.²^ORCID,Jung J.¹^ORCID,Chow K. H.¹^ORCID

Affiliation:

1. Department of Physics, University of Alberta 1 , Edmonton, Alberta T6G 2E1, Canada

2. Department of Physics, American University of Sharjah 2 , Sharjah, United Arab Emirates

Abstract

We investigate the electrical and thermal conduction properties of low- (ON) and high-resistance (OFF) states in Pt/NiOx/Pt based unipolar ReRAM devices during cooling and warming cycles between 300 and 180 K. The conduction electron-trap activation energy was found to decrease upon warming. Although thermal cycling did not significantly affect the average resistance-temperature coefficient of the Pt diffused conductive filaments in the system, the ON-state resistance fluctuations increase at high temperatures, indicating that ambient temperature significantly affects the sizes of the formed filaments. The mechanism behind these thermally activated changes is discussed.

Funder

Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0151967/18007795/253501_1_5.0151967.pdf

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