In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2767149
Reference13 articles.
1. Fabrication of metallic electrodes with nanometer separation by electromigration
2. Nanomechanical oscillations in a single-C60 transistor
3. Coulomb blockade and the Kondo effect in single-atom transistors
4. Kondo resonance in a single-molecule transistor
5. Inelastic Electron Tunneling via Molecular Vibrations in Single-Molecule Transistors
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