1. Leakage sources and possible solutions in nanometer CMOS technologies
2. Energy dissipation and transport in nanoscale devices
3. 2 Mb SPRAM (SPin-Transfer Torque RAM) With Bit-by-Bit Bi-Directional Current Write and Parallelizing-Direction Current Read
4. D. Halupka, S. Huda, W. Song, A. Sheikholeslami, K. Tsunoda, C. Yoshida, and M. Aoki, IEEE Int. Solid-State Circuits Conf. 2010, 256.
5. K. Tsuchida, T. Inaba, K. Fujita, Y. Ueda, T. Shimizu, Y. Asao, T. Kajiyama, M. Iwayama, K. Sugiura, S. Ikegawa, T. Kishi, T. Kai, M. Amano, N. Shimomura, H. Yoda, and Y. Watanabe, IEEE Int. Solid-State Circuits Conf. 2010, 258.