Ultrathin responsive polyelectrolyte brushes studied by infrared synchrotron mapping ellipsometry-Reference-Cited by-同舟云学术

Ultrathin responsive polyelectrolyte brushes studied by infrared synchrotron mapping ellipsometry

Published:2008-03-10 Issue:10 Volume:92 Page:103102
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Roodenko Katy,Mikhaylova Yulia,Ionov Leonid,Gensch Michael,Stamm Manfred,Minko Sergiy,Schade Ulrich,Eichhorn Klaus-Jochen,Esser Norbert,Hinrichs Karsten

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2892132

Reference19 articles.

1. Handbook of Ellipsometry

2. Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry

3. Instrumentation for FT-IR reflection spectroscopy with synchrotron radiation

4. Microfocus-infrared synchrotron ellipsometer for mapping of ultra thin films

5. Infrared spectroscopic ellipsometry applied to the characterization of nano-structures of silicon IC manufacturing

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