Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry
Author:
Affiliation:
1. ISAS—Institute for Analytical Sciences, Department Berlin, Albert-Einstein-Str. 9, 12489 Berlin, Germany
Publisher
SAGE Publications
Subject
Spectroscopy,Instrumentation
Link
http://journals.sagepub.com/doi/pdf/10.1366/000370205774783106
Reference107 articles.
1. Infrared ellipsometry study of the thickness-dependent vibration frequency shifts in silicon dioxide films
2. Infrared ellipsometry study of evaporated SiO2 films: Matrix densification, porosity, water sorption
3. Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity
4. Spectroscopic ellipsometry studies of very thin thermally grown SiO2films: Influence of oxidation procedure on oxide quality and stress
5. Change of TO and LO mode frequency of evaporated SiO2 films during aging in air
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