Ultimate resolution electron energy loss spectroscopy at H/Si(100) surfaces
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.369038
Reference39 articles.
1. Scanning tunnelling microscopy of the interaction of hydrogen with silicon surfaces
2. Surface infrared spectroscopy
3. Electronic and structural properties of hydrogen on semiconductor surfaces
4. Measuring the structure of etched silicon surfaces with Raman spectroscopy
5. Study of Physics and Chemistry of Surfaces from Frustrated Total Internal Reflections
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2. FTIR Measurement of the Hydrogenated Si(100) Surface: The Structure-Vibrational Interpretation by Means of Periodic DFT Calculation;The Journal of Physical Chemistry C;2021-04-27
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4. Design for a high resolution electron energy loss microscope;Ultramicroscopy;2019-12
5. A novel system-bath Hamiltonian for vibration-phonon coupling: Formulation, and application to the relaxation of Si–H and Si–D bending modes of H/D:Si(100)-(2 × 1);Chemical Physics;2017-01
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