FTIR Measurement of the Hydrogenated Si(100) Surface: The Structure-Vibrational Interpretation by Means of Periodic DFT Calculation-Reference-Cited by-同舟云学术

FTIR Measurement of the Hydrogenated Si(100) Surface: The Structure-Vibrational Interpretation by Means of Periodic DFT Calculation

Published:2021-04-27 Issue:17 Volume:125 Page:9219-9228
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Šebera Jakub¹^ORCID,Zemen Jan²,Jirásek Vít³,Holovský Jakub²⁴^ORCID,Sychrovský Vladimír¹²^ORCID

Affiliation:

1. Institute of Organic Chemistry and Biochemistry, Academy of Sciences of the Czech Republic, v.v.i., Flemingovo Náměstí 2, Praha 6, Praha 166 10, Czech Republic

2. Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University, Technická 2, Praha 6, Praha 166 27, Czech Republic

3. Institute of Plasma Physics, Czech Academy of Sciences, Za Slovankou 3, Praha 182 00, Czech Republic

4. Institute of Physics, Czech Academy of Sciences, v. v. i., Cukrovarnická 10, Praha 162 00, Czech Republic

Funder

Ministerstvo ?kolstv?, Ml?de?e a Telov?chovy

Grantov? Agentura Cesk? Republiky

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.0c11176

Reference53 articles.

1. Infrared spectroscopy of hydrogen on silicon surfaces

2. High-resolution infrared spectroscopy of adsorbates on semiconductor surfaces: Hydrogen on Si(100) and Ge(100)

3. Semiconductivity Transition in Silicon Nanowires by Hole Transport Layer

4. Role of bond-strain in the chemistry of hydrogen on the Si(100) surface

5. Ultimate resolution electron energy loss spectroscopy at H/Si(100) surfaces

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