W(Zn) selectively deposited and locally diffused ohmic contacts top‐InGaAs/InP formed by rapid thermal low pressure metalorganic chemical vapor deposition

Author:

Katz A.,El‐Roy A.,Feingold A.,Geva M.,Moriya N.,Pearton S. J.,Lane E.,Keel T.,Abernathy C. R.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Lower limits to metal-semiconductor contact resistance: Theoretical models and experimental data;Journal of Applied Physics;2013-10-21

2. Lower limits to specific contact resistivity;2012 International Conference on Indium Phosphide and Related Materials;2012-08

3. Mechanisms of current flow in metal-semiconductor ohmic contacts;Semiconductors;2007-11

4. Comparative studies of p-type InP layers formed by Zn3As2 and Zn3P2 diffusion;Journal of Electronic Materials;2003-09

5. Stoichiometry control and point defects in compound semiconductors;Materials Chemistry and Physics;2000-04

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