Research on three dimensional machining effects using atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3125623
Reference25 articles.
1. Scanning Probe Lithography
2. Nanometer‐scale oxidation of Si(100) surfaces by tapping mode atomic force microscopy
3. Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication
4. Nanometer Modifications of Non-Conductive Materials Using Resist-Films by Atomic Force Microscopy
5. Fabrication of nanostructures using atomic‐force‐microscope‐based lithography
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4. Oil as an Enabler for Efficient Materials Removal in Three-Dimensional Scanning Probe Microscopy Applications;Frontiers in Mechanical Engineering;2021-12-21
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