An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature-Reference-Cited by-同舟云学术

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An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature

Published:2020-06-01 Issue:6 Volume:91 Page:063702
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Heard Rhiannon¹^ORCID,Huber John E.¹^ORCID,Siviour Clive¹^ORCID,Edwards Gary²,Williamson-Brown Ed²,Dragnevski Kalin¹^ORCID

Affiliation:

1. Solid Mechanics Group, Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom

2. Deben United Kingdom Ltd., Brickfields Business Park, Old Stowmarket Road, Woolpit, Bury St Edmunds, Suffolk IP30 9QS, United Kingdom

Funder

Engineering and Physical Sciences Research Council

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5144981

Reference21 articles.

1. Investigation of the α−γ−α Phase Transformation in Steel: High-Temperature In Situ EBSD Measurements

2. In situ environmental scanning electron microscope observations of catalytic processes encountered in metal dusting corrosion on iron and nickel

3. EBSD coupled to SEM in situ annealing for assessing recrystallization and grain growth mechanisms in pure tantalum

4. Laser powered heating stage in a scanning electron microscope for microstructural investigations at elevated temperatures

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1. Effect of thermal etching and oxidation on in situ characterisation of grain growth in carbon steel;Journal of Alloys and Metallurgical Systems;2024-09

2. Development of a microfurnace dedicated to in situ scanning electron microscope observation up to 1300 °C. II. Study of the thermal response of samples;Review of Scientific Instruments;2024-05-01

3. Development of a microfurnace dedicated to in situ scanning electron microscope observation up to 1300 °C. III. In situ high temperature experiments;Review of Scientific Instruments;2024-05-01

4. Direct Visualization of Chemical Transport in Solid-State Chemical Reactions by Time-of-Flight Secondary Ion Mass Spectrometry;Nano Letters;2024-03-13

5. Development and application of a high-temperature imaging system for in-situ scanning electron microscope;Materials Today Communications;2024-03

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