Development and application of a high-temperature imaging system for in-situ scanning electron microscope-Reference-Cited by-同舟云学术

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Development and application of a high-temperature imaging system for in-situ scanning electron microscope

Published:2024-03 Issue: Volume:38 Page:107782
ISSN:2352-4928
Container-title:Materials Today Communications
language:en
Short-container-title:Materials Today Communications

Author:

Zhang Yixu,Tang Liang,Wang Yongfeng,Wang Jin,Zhou Jianli,Lu Junxia,Zhang Yuefei,Zhang Ze

Funder

Shanxi-Zheda Institute of Advanced Materials and Chemical Engineering

National Major Science and Technology Projects of China

Publisher

Elsevier BV

Subject

Materials Chemistry,Mechanics of Materials,General Materials Science

Reference37 articles.

1. An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature;Heard;Rev. Sci. Instrum.,2020

2. Laser powered heating stage in a scanning electron microscope for microstructural investigations at elevated temperatures;Kirch;Rev. Sci. Instrum.,2008

3. High temperature in-situ SEM observation and crystal plasticity simulation on fretting fatigue of Ni-based single crystal superalloys;Su;Int. J. Plast.,2020

4. In-situ SEM study of fatigue crack growth behaviour in IN718;Andersson;Int. J. Fatigue,2004

5. In-situ SEM study of slip-controlled short-crack growth in single-crystal nickel superalloy;Zhang;Mater. Sci. Eng.: A,2019

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1. Heated-Stage Small-Angle X-Ray Scattering for Quantification of Precipitate Fields and Their Evolution During Process Simulation of AA7050;Metals and Materials International;2024-08-13

2. Spatiotemporal prediction and characterization of microstructure evolution during in-situ heat treatment using a deep learning algorithm;Materials Today Nano;2024-06

3. Development of a microfurnace dedicated to in situ scanning electron microscope observation up to 1300 °C. II. Study of the thermal response of samples;Review of Scientific Instruments;2024-05-01

4. Development of a microfurnace dedicated to in situ scanning electron microscope observation up to 1300 °C. I. Concept, fabrication, and validation;Review of Scientific Instruments;2024-05-01

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