Neutron diffraction study on the defect structure of indium–tin–oxide
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1341209
Reference19 articles.
1. Properties of Sn‐Doped In2 O 3 Films Prepared by RF Sputtering
2. Electrical properties and defect model of tin-doped indium oxide layers
3. Structural aspects and defect chemistry in In2O3
4. Refinement of the crystal structure of In2O3 at two wavelengths
5. Electrical properties of In2O3
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