Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy-Reference-Cited by-同舟云学术

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Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy

Published:2020-08-01 Issue:8 Volume:10 Page:085010
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Nakamura Tomonori¹^ORCID,Ishida Nobuyuki¹²,Sagisaka Keisuke¹²,Koide Yasuo¹^ORCID

Affiliation:

1. Center for GaN Characterization and Analysis, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan

2. Research Center for Advanced Measurement and Characterization, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan

Funder

JSPS KAKENHI

National Institute for Materials Science

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0007524

Reference30 articles.

1. GaN: Processing, defects, and devices

2. A Review of GaN on SiC High Electron-Mobility Power Transistors and MMICs

3. High Voltage Vertical GaN p-n Diodes With Avalanche Capability

4. Effect of temperature on Ga2O3(Gd2O3)/GaN metal–oxide–semiconductor field-effect transistors

5. AlGaN/GaN metal oxide semiconductor heterostructure field effect transistor

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1. Breakdown Voltage and Leakage Current of the Nonuniformly Activated Lightly Doped p-GaN;IEEE Transactions on Electron Devices;2024-09

2. Local electrical characteristic of memristor structure in a high-resistance state obtained using electrostatic force microscopy: Fractal and multifractal dynamics of surface;Applied Surface Science;2024-02

3. Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM;Nanotechnology;2023-11-24

4. Fabrication of Cu oxide/TiO2 p–n nanojunctions by stress-induced migration;Journal of Applied Physics;2023-03-17

5. A transversal approach to predict surface charge compensation in piezoelectric force microscopy;Applied Surface Science;2023-01

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