Interfacial defects in thin refractory metal films imaged by low-energy electron microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.123918
Reference5 articles.
1. Observation of buried interfaces with low energy electron microscopy
2. LEEM Investigation of Refractory Metals Grown on Insulating Substrates: Nb (110) on Sapphire $(11\bar{2}0)$
3. A low‐energy electron diffraction investigation of the surface deformation induced by misfit dislocations in thin MgO films grown on Fe(001)
4. Atomic structure of epitaxial Nb-Al2O3interfaces II. Misfit dislocations
5. Defects on the surface of Mo{011} observed by low-energy electron microscopy
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1. LEEM, SPLEEM and SPELEEM;Springer Handbook of Microscopy;2019
2. Applications in Surface Science;Surface Microscopy with Low Energy Electrons;2014
3. Strain-induced nonequilibrium magnetoelastic domain structure and spin reorientation of NiO(100);Physical Review B;2009-11-09
4. Step fluctuations and step interactions on Mo(011);Surface Science;2003-09
5. Studies of threading dislocations in Nb(011) films;Philosophical Magazine;2003-01
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