Inverted scanning microwave microscope for in vitro imaging and characterization of biological cells

Author:

Farina Marco1ORCID,Jin Xin2,Fabi Gianluca1,Pavoni Eleonora1,di Donato Andrea1ORCID,Mencarelli Davide1,Morini Antonio1,Piacenza Francesco3,Al Hadi Richard4,Zhao Yan4ORCID,Ning Yaqing2,Pietrangelo Tiziana5ORCID,Cheng Xuanhong6,Hwang James C. M.2

Affiliation:

1. Department of Information Engineering, Università Politecnica delle Marche, Via Brecce Bianche, 60131 Ancona, Italy

2. Department of Electrical and Computer Engineering, Lehigh University, Bethlehem, Pennsylvania 18015, USA

3. Advanced Technology Center for Aging Research, Scientific Technological Area, IRCCS INRCA, Via Birarelli 8, 60121 Ancona, Italy

4. Alcatera LLC, Los Angeles, California 90024, USA

5. Department of Neuroscience, Imaging and Clinical Sciences, University G d'Annunzio Chieti-Pescara, I-66013 Chieti, Italy

6. Department of Materials Science and Engineering and Department of Bioengineering, Lehigh University, Bethlehem, Pennsylvania 18015, USA

Funder

Army Research Office

Air Force Office of Scientific Research

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Inverted Scanning Microwave Microscopy of GaN/AlN High-Electron Mobility Transistors;2024 103rd ARFTG Microwave Measurement Conference (ARFTG);2024-06-21

2. Johnson-noise-limited cancellation-free microwave impedance microscopy with monolithic silicon cantilever probes;Nature Communications;2024-06-13

3. Terahertz nanoscopy: Advances, challenges, and the road ahead;Applied Physics Reviews;2024-04-10

4. The Characterization of Near-Field Microwave Radiation Via Scanning Probe Microscopy;2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI);2023-08-09

5. Near-Field Microwave Microscopy for 3D Surface Assessment of Manufactured Structures;IEEE Journal of Microwaves;2023-07

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