Microscopic observation of lateral and vertical charge transportation in Si nanocrystals sandwiched by amorphous SiC layers-Reference-Cited by-同舟云学术

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Microscopic observation of lateral and vertical charge transportation in Si nanocrystals sandwiched by amorphous SiC layers

Published:2018-01 Issue:1 Volume:8 Page:015224
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Xu Jie¹²^ORCID,Ji Yang²,Lu Peng³,Bai Gang¹,Ren Qingying¹,Xu Jun²

Affiliation:

1. College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China

2. National Laboratory of Solid State Microstructures and School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China

3. No. 14 Research Institute of China Electronics Technology Group Corporation, Nanjing 210039, China

Funder

Open Project Program of National Laboratory of Solid State Microstructures

National Natural Science Foundation of China

Nanjing University of Posts and Telecommunications

Natural Science Foundation of Jiangsu Province

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5020239

Reference36 articles.

1. Multicolor Silicon Light-Emitting Diodes (SiLEDs)

2. Silicon nanostructures for photonics and photovoltaics

3. High-efficiency silicon hybrid solar cells employing nanocrystalline Si quantum dots and Si nanotips for energy management

4. Silicon quantum dot/crystalline silicon solar cells

5. Developments in nanocrystal memory

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy;physica status solidi (a);2020-09-22

2. Anisotropic Diffusion of Charges on Au Nanoclusters Embedded in Al 2 O 3 Dielectrics;physica status solidi (RRL) – Rapid Research Letters;2019-12-11

3. Microscopic and Macroscopic Bipolar Injection and Carrier Recombination in Single-layer Si Nanocrystals;IOP Conference Series: Materials Science and Engineering;2018-10-23

4. Nanoscale Characterization of Active Doping Concentration in Boron-Doped Individual Si Nanocrystals;physica status solidi (a);2018-10-05

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