An Electron Transport Model for the Prediction of X‐Ray Production and Electron Backscattering in Electron Microanalysis
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1708054
Reference14 articles.
1. The Intensity of Emission of Characteristic X-Radiation
2. Back Scattering of Electrons
3. The present state of quantitative X-ray microanalysis Part 2: Computational methods
4. A Monte Carlo Calculation of the Spatial Distribution of Characteristic X-ray Production in a Solid Target
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