Thin-film characterization with x-ray microanalysis. Extending and improving invariant embedding results
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference18 articles.
1. Electron Microprobe Analysis (2nd edn). Cambridge University Press: Cambridge, 1993.
2. Simulation and Modelling of Thin Film φ(ρz) Curves for Electron Probe Microanalysis
3. Recent progress in electron probe microanalysis
4. Slowing down of medium-energy electrons in solids
5. Application of the Pontriaguin Method to a Simple Model for Electron Probe Microanalysis
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Progress in Materials Science;2021-07
2. Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Progress in Materials Science;2021-02
3. Backscattering and absorption coefficients for electrons: Solutions of invariant embedding transport equations using a method of convergence;Journal of Applied Physics;2014-05-21
4. The method of convergence to calculate particles fluxes in X rays spectrometry techniques. Application in nuclear compounds;Journal of Applied Physics;2012-12
5. Invariant embedding approach to microanalysis: Procedure to thin film characterization;Journal of Applied Physics;2006-02-15
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3