Invariant embedding approach to microanalysis: Procedure to thin film characterization
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2173684
Reference26 articles.
1. Recent progress in electron probe microanalysis
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4. Scattering angle dependence of the surface excitation probability in reflection electron energy loss spectra
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