Entropic uncertainty relations for measurements assigned to a projective two-design

Abstract

The current study aims to examine uncertainty relations for quantum measurements assigned to a projective two-design. Complete sets of mutually unbiased bases and symmetric informationally complete measurements are important cases of such measurements. To characterize the amount of uncertainty, we use the Tsallis and Rényi entropies as well as the probabilities of separate outcomes. The obtained results are based on an estimation of the index of coincidence. They improve some uncertainty relations given in the literature.