Capacitance‐voltage profiling of quantum well structures-Reference-Cited by-同舟云学术

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Capacitance‐voltage profiling of quantum well structures

Published:1996-05-01 Issue:9 Volume:79 Page:7005-7013
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:

Author:

Tschirner B. M.¹,Morier‐Genoud F.¹,Martin D.¹,Reinhart F. K.¹

Affiliation:

1. Institut de micro‐et optoélectronique, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference16 articles.

1. M. A. Hermann, D. Bimberg, and J. Christen, J. Appl. Phys. 70, R1 (1991).JAPIAU0021-8979

2. D. V. Lang, A. M. Sergent, M. B. Panish, H. Temkin, Appl. Phys. Lett. 49, 812 (1986).APPLAB0003-6951

3. H. Kroemer and W. Y. Chien, Solid-State Electron. 24, 655 (1981).SSELA50038-1101

4. M. Sudaram and A. C. Gossard, J. Appl. Phys. 73, 251 (1993).JAPIAU0021-8979

5. J. S. Rimmer, B. Hamilton, P. Dawson, M. Missous, and A. R. Peaker, J. Appl. Phys. 73, 5032 (1993).JAPIAU0021-8979

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