Correlation of electrical characteristics with interface chemistry and structure in Pt/Ru/PbZr0.52Ti0.48O3/Pt capacitors after post metallization annealing-Reference-Cited by-同舟云学术

Correlation of electrical characteristics with interface chemistry and structure in Pt/Ru/PbZr0.52Ti0.48O3/Pt capacitors after post metallization annealing

Published:2018-09-24 Issue:13 Volume:113 Page:132901
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Gueye Ibrahima¹^ORCID,Le Rhun Gwenael¹,Renault Olivier¹,Cooper David¹,Defay Emmanuel²,Barrett Nicholas³^ORCID

Affiliation:

1. Université Grenoble Alpes, CEA, LETI, 38000 Grenoble, France

2. Luxembourg Institute of Science and Technology, Material Research and Technology Department, 41 Rue du Brill, L-4422 Belvaux, Luxembourg

3. SPEC, CEA, CNRS, Université Paris Saclay, F-91191 Gif-sur-Yvette, France

Funder

Fonds National de la Recherche Luxembourg

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5041767

Reference28 articles.

1. Ferroelectric and piezoelectric thin films and their applications for integrated capacitors, piezoelectric ultrasound transducers and piezoelectric switches

2. Polarization fatigue in ferroelectric thin films and related materials

3. Polarization dependence of Schottky barrier heights at interfaces of ferroelectrics determined by photoelectron spectroscopy

4. Metal-ferroelectric-metal heterostructures with Schottky contacts. I. Influence of the ferroelectric properties

5. Interface electronic structure in a metal/ferroelectric heterostructure under applied bias

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