Measurement of deep levels in hydrogenated amorphous silicon by transient voltage spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.93822
Reference10 articles.
1. Trap spectroscopy of a-Si:H diodes using transient current techniques
2. Direct Measurement of the Bulk Density of Gap States inn-Type Hydrogenated Amorphous Silicon
3. Determination of the Density of State Distribution of a-Si:H by Isothermal Capacitance Transient Spectroscopy
4. Measurement of the density of gap states in hydrogenated amorphous silicon by space charge spectroscopy
5. Calculation of the dynamic response of Schottky barriers with a continuous distribution of gap states
Cited by 50 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Spectral response characterization of a-Si:H-based MIS-type photosensors;physica status solidi (c);2008-08
2. Semiconductors, Amorphous-Electronic Properties;digital Encyclopedia of Applied Physics;2003-04-15
3. Defects;Advances in Condensed Matter Science;2003-04-10
4. Mid-gap states measurements of low-level boron-doped a-Si:H films;Journal of Non-Crystalline Solids;2000-05
5. Characterization of mid-gap states in HVPE and MOVPE-grown n-type GaN;Journal of Crystal Growth;1998-06
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3