Operation of a single column focused ion/electron beam system based on a dual ion/electron source
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.122426
Reference7 articles.
1. HIGH SPATIAL RESOLUTION SIMS WITH THE UC-HRL SCANNING ION MICROPROBE
2. Vacuum lithography for three-dimensional fabrication using finely focused ion beams
3. Buried‐heterostructure lasers fabricated byinsituprocessing techniques
4. Combining transmission electron microscopy with focused ion beam sputtering for microstructural investigations of AlGaAs/GaAs heterojunction bipolar transistors
5. Stable field-induced electron emission from a solidified liquid metal ion source
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Prolonged electron emission as a method to fabricate a stable and bright dual ion/electron point source;Applied Physics Letters;2005-11-07
2. Emission properties of a dual ion/electron point emitter based on In–Bi alloy;Applied Physics Letters;2003-09-15
3. Formation of a nano-emitter for electron field emission on a liquid metal ion source tip after solidification of the alloy;Vacuum;2002-12
4. Emission properties of a dual ion/electron source based on Au–In alloy;Applied Physics Letters;2002-02-25
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