Piezoelectric push–pull micropositioner for ballistic electron emission microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1148030
Reference6 articles.
1. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
2. Observation of Interface Band Structure by Ballistic-Electron-Emission Microscopy
3. Hot electron scattering processes in metal films and at metal-semiconductor interfaces
4. Scanning tunneling microscopy
5. Two‐dimensional, remote micropositioner for a scanning tunneling microscope
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3. Planar frictional micro-conveyors with two degrees of freedom;Journal of Micromechanics and Microengineering;2008-05-02
4. Design and Development of a Piezoelectric Actuator for the Scanning Probe Microscope Used in Ultrahigh Vacuum;Journal of Mechanics;2007-06
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