An alternative flat scanner and micropositioning method for scanning probe microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3505781
Reference23 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Atomic Force Microscope
3. NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES
4. Optimal tracking of piezo-based nanopositioners
5. Fast spiral-scan atomic force microscopy
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