Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon-Reference-Cited by-同舟云学术

Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon

Published:2010-09-15 Issue:6 Volume:108 Page:063528
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Ganapati Vidya,Schoenfelder Stephan,Castellanos Sergio,Oener Sebastian,Koepge Ringo,Sampson Aaron,Marcus Matthew A.,Lai Barry,Morhenn Humphrey,Hahn Giso,Bagdahn Joerg,Buonassisi Tonio

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3468404

Reference123 articles.

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