Trap-state density in continuous-wave laser-crystallized single-grainlike silicon transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2209198
Reference20 articles.
1. High Performance Low Temperature Polycrystalline Silicon Thin Film Transistors on Non-alkaline Glass Produced Using Diode Pumped Solid State Continuous Wave Laser Lateral Crystallization
2. A new era of crystallization: advances in polysilicon crystallization and crystal engineering
3. Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors
4. Determination of gap state density in polycrystalline silicon by field‐effect conductance
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