A new setup for high resolution fast X-ray reflectivity data acquisition
Author:
Affiliation:
1. Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
2. Max-Planck-Institute for Solid State Research, Heisenbergstraße 1, 70569 Stuttgart, Germany
Publisher
AIP Publishing
Subject
Instrumentation
Reference19 articles.
1. X-ray reflection from rough layered systems
2. J. Als-Nielsen and D. McMorrow, Elements of Modern X-ray Physics (Wiley, New York, 2001).
3. J. Daillant and A. Gibaud, X-Ray and Neutron Reflectivity: Principles and Applications (Springer, Berlin Heidelberg, 1999).
4. M. Tolan, X-Ray Scattering from Soft-Matter Thin Films (Springer, Berlin Heidelberg, 1999).
5. Simultaneous in situ measurements of x-ray reflectivity and optical spectroscopy during organic semiconductor thin film growth
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