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Correcting lateral chromatic aberrations in non-monochromatic X-ray microscopy

  • Published:2016-08 Issue:5 Volume:109 Page:054103
  • ISSN:0003-6951
  • Container-title:Applied Physics Letters
  • language:en
  • Short-container-title:Appl. Phys. Lett.

Author:

Falch Ken Vidar1,Detlefs Carsten2ORCID,Di Michiel Marco2,Snigireva Irina2,Snigirev Anatoly3ORCID,Mathiesen Ragnvald H.1ORCID

Affiliation:

1. Department of Physics, Norwegian University of Science and Technology, Høgskoleringen 1, 7491 Trondheim, Norway

2. European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France

3. Immanuel Kant Baltic Federal University, 238300 Kaliningrad, Russia

Funder

Ministry of Education and Science of the Russian Federation

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Probing nanoscale structure and strain by dark-field x-ray microscopy;MRS Bulletin;2020-04

2. Multi scale hard x-ray microscopy;Current Opinion in Solid State and Materials Science;2020-04

3. Hard X-ray in-situ full-field microscopy for material science applications;OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS);2020

4. Full-field neutron microscopy based on refractive optics;Journal of Applied Crystallography;2019-10-22

5. The ESRF dark-field x-ray microscope at ID06;IOP Conference Series: Materials Science and Engineering;2019-08-01
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