Achromatic and high-resolution full-field X-ray microscopy based on total-reflection mirrors-Reference-Cited by-同舟云学术

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Achromatic and high-resolution full-field X-ray microscopy based on total-reflection mirrors

Published:2015-04-08 Issue:8 Volume:23 Page:9746
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Matsuyama Satoshi,Emi Yoji,Kino Hidetoshi,Kohmura Yoshiki,Yabashi Makina,Ishikawa Tetsuya,Yamauchi Kazuto

Funder

Iketani Science and Technology Foundation

Japan Science and Technology Agency

Japan Society for the Promotion of Science (JSPS)

Konica Minolta Imaging Science Foundation

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference20 articles.

1. Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm

2. Zone-doubled Fresnel zone plates for high-resolution hard X-ray full-field transmission microscopy

3. Hard x-ray nanoprobe based on refractive x-ray lenses

4. High spatial resolution hard X-ray microscope using X-ray refractive lens and phase contrast imaging experiments

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2. Basic principles and optical system design of 17.48 keV high-throughput modified Wolter x-ray microscope;Review of Scientific Instruments;2022-09-01

3. Development of projection X-ray microscope with 100 nm spot size;Nondestructive Testing and Evaluation;2022-07-06

4. Soft X-ray ptychography system using a Wolter mirror for achromatic illumination optics;Optics Express;2022-07-05

5. Staircase array of inclined refractive multi-lenses for large field of view pixel super-resolution scanning transmission hard X-ray microscopy;Journal of Synchrotron Radiation;2021-03-12

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