Nanoscale subsurface imaging via resonant difference-frequency atomic force ultrasonic microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2743908
Reference18 articles.
1. Atomic Force Microscope
2. Acoustic microscopy by atomic force microscopy
3. Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment
4. Atomic force acoustic microscopy methods to determine thin-film elastic properties
5. Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy
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