In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.122008
Reference10 articles.
1. Medium‐wavelength, normal‐incidence, p‐type Si/SiGe quantum well infrared photodetector with background limited performance up to 85 K
2. Lattice relaxation of nanostructured semiconductor pillars observed by high‐resolution x‐ray diffraction
3. Triple crystal x‐ray diffractometry of periodic arrays of semiconductor quantum wires
4. Shear strains in dry etched GaAs/AlAs wires studied by high resolution x-ray reciprocal space mapping
5. X‐ray diffraction reciprocal space mapping of a GaAs surface grating
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