Scanning microwave imaging of optically patterned Ge2Sb2Te5

Author:

Johnston Scott R.1ORCID,Ng Edwin1,Fong Scott W.2ORCID,Mok Walter Y.3,Park Jeongwon34ORCID,Zalden Peter35,Sakdinawat Anne3,Wong H.-S. Philip2,Mabuchi Hideo1,Shen Zhi-Xun16

Affiliation:

1. Department of Applied Physics, Stanford University, Stanford, California 94305, USA

2. Department of Electrical Engineering, Stanford University, Stanford, California 94305, USA

3. SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA

4. School of Electrical Engineering and Computer Science, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada

5. European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany

6. Department of Physics, Stanford University, Stanford, California 94305, USA

Funder

National Science Foundation

Defense Advanced Research Projects Agency

Gordon and Betty Moore Foundation

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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