Trap‐assisted charge injection in MNOS structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1662016
Reference12 articles.
1. Charge Transport and Storage in Metal‐Nitride‐Oxide‐Silicon (MNOS) Structures
2. CHARGE STORAGE MODEL FOR VARIABLE THRESHOLD FET MEMORY ELEMENT
3. Properties of MNOS structures
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