Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2738946
Reference32 articles.
1. Nanoscale thermal transport
2. Thermal mapping of defects in AlGaN∕GaN heterostructure field-effect transistors using micro-Raman spectroscopy
3. Kapitza conductance and heat flow between solids at temperatures from 50 to 300 K
4. Thermal imaging of electronic devices with low surface emissivity
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