Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4767383
Reference19 articles.
1. Measurement and calculation of polarization and potential-energy effects on core-electron binding energies in solids: X-ray photoemission of rare gases implanted in noble metals
2. Core level shifts of rare-gas atoms implanted in the noble metals
3. Core-level electronic structures of rare-gas atoms implanted in transition metals studied by XPS and XAES
4. Xe and Ar nanobubbles in Al studied by photoemission spectroscopy
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1. Critical method evaluation refutes the Ar 2p signal of implanted Ar for referencing X-ray photoelectron spectra;Applied Surface Science;2023-10
2. Argon Embedded by Ion Bombardment: Relevance of Hidden Dopants in Rutile TiO2;The Journal of Physical Chemistry C;2019-07-22
3. Order-of-magnitude differences in retention of low-energy Ar implanted in Si and SiO2;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2016-09
4. Binding energy referencing for XPS in alkali metal-based battery materials research (I): Basic model investigations;Applied Surface Science;2015-10
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