Critical method evaluation refutes the Ar 2p signal of implanted Ar for referencing X-ray photoelectron spectra-Reference-Cited by-同舟云学术

Critical method evaluation refutes the Ar 2p signal of implanted Ar for referencing X-ray photoelectron spectra

Published:2023-10 Issue: Volume:635 Page:157598
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Greczynski G.^ORCID,Hultman L.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference75 articles.

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4. Energy calibration of electron spectrometers

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