Raman scattering of SiC: Application to the identification of heteroepitaxy of SiC polytypes
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.338157
Reference8 articles.
1. Production of large‐area single‐crystal wafers of cubic SiC for semiconductor devices
2. Experimental 3C-SiC MOSFET
3. Schottky‐barrier field‐effect transistors of 3C‐SiC
4. Raman Scattering in6HSiC
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